Contracted analysis and SEM observation services.
Contracted analysis and SEM observation services.
The highest measurement accuracy achieved for evaluating various materials and thin films at the nano level Tool Tech Tohoku Co., Ltd. "Contract Analysis and SEM Observation" ■□■Features■□■ ■nano Hardness Tester ... Hardness and Young's Modulus - Displacement resolution: 0.03nm Load resolution: 1μm - Sapphire ring system to suppress thermal drift effects - Surface observation using a microscope and AFM ■Scratch Tester ... Adhesion Strength - Measurement of adhesion strength for thin films ranging from 10nm to 20μm - Observation of scratch marks using a microscope - Measurement on curved surfaces possible with feedback mechanism ■Tribometer ... Friction and Wear - Load: 50μN to 1N (NTR) 1N to 20N (TRB, HTT) - Rotational and reciprocating friction (only NTR) possible - Stress analysis simulation function for ball and substrate ■Calotest, AFM, NST ... Film Thickness and Surface Shape - Measurement of film thickness for multilayer films - Various analyses possible with analysis software - Measurement of shape and wear amount using nano Scratch Tester (NST) ■For more details, please contact us.
- Company：ツール・テック東北
- Price：Other
